Colossal magnetoresistance La5/8Sr3/8MnO3 (LSMO) thin films were directly grown on MgO(100), Si(100) wafer and glass substrates by pulsed laser deposition technique. The films were characterized using X-ray diffraction (XRD), field emission-scanning electron microscope and atomic force microscopy (AFM). The electrical and magnetic properties of the films are studied. From the XRD patterns, the films are found to be polycrystalline singlephases. The surface appears porous and cauliflower-like morphology for all LSMO films. From AFM images, the LSMO films deposited on glass substrate were presented smooth morphologies of the top surfaces as comparing with the films were deposited on Si(100) and MgO(100). The highest magnetoresistance (MR) value obtained was −17.