Abstract:In this paper, 650 V / 7.5 A rated enhancement-mode (E-mode) Gallium Nitride (GaN) highelectron-mobility-transistors (HEMTs) with integrated gate drivers are characterized under thousands of accelerated thermal cycles (ATC) at different junction temperature stresses. This research helps in developing fundamental insights into GaN HEMTs' aging characteristics through the degradation of ten devices under ATC tests. For over 20,000 thermal cycles, the forward and reverse conduction losses, IGSS, Coss, and the RDS… Show more
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