1994
DOI: 10.1007/bf00730398
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Characterization of epitaxial Bi2Sr2CaCu2O8+? thin films

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Cited by 4 publications
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“…Furthermore, the presence of a plasma and high deposition pressures hamper the use of most in situ characterization methods such as LEED or RHEED, which are widely used in other approaches. Nevertheless, superlattices and multilayer HTS films have been grown with various sputter techniques (figure 7) (Suzuki et al 1994, Wagner et al 1994, Li et al 1994b, Satoh et al 1994 as well as multilayer heterostructures involving e.g. HTSs and magnetoresistive compounds (Jakob et al 1995).…”
Section: Sputter Techniquesmentioning
confidence: 99%
“…Furthermore, the presence of a plasma and high deposition pressures hamper the use of most in situ characterization methods such as LEED or RHEED, which are widely used in other approaches. Nevertheless, superlattices and multilayer HTS films have been grown with various sputter techniques (figure 7) (Suzuki et al 1994, Wagner et al 1994, Li et al 1994b, Satoh et al 1994 as well as multilayer heterostructures involving e.g. HTSs and magnetoresistive compounds (Jakob et al 1995).…”
Section: Sputter Techniquesmentioning
confidence: 99%