2002
DOI: 10.1515/ijnsns.2002.3.3-4.617
|View full text |Cite
|
Sign up to set email alerts
|

Characterization of Electronic Transients by an Ultrafast Scanning Tunneling Microscope

Abstract: In this paper, we report experimental results of picosecond electrical transients pumped by ultrashort laser pulses on a coplanar strip line with an ultrafast scanning tunneling microscope. The resolved transient signal has a rise time in non-contact mode of 1.21 ps and the FWHM is 1.19 ps. Our measurements showed that the amplitude and the shape of the transient signals are independent of the magnitude and the polarity of the dc tunneling current, which confirms the capacitive coupling of the transient signal… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 11 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?