Characterization of Electron-beam Deposited TiO2/SiO2 Coatings Based on Multi-Sample Photometric and Ellipsometric Data

Amochkina, T. V.; Trubetskov, Michael K.; Janicki, Vesna; Parramon, Jordi Sancho

doi:10.1364/oic.2022.tha.5

Optical Interference Coatings Conference (OIC) 2022 2022

DOI: 10.1364/oic.2022.tha.5

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Characterization of Electron-beam Deposited TiO2/SiO2 Coatings Based on Multi-Sample Photometric and Ellipsometric Data

T. V. Amochkina¹,

Michael K. Trubetskov²,

Vesna Janicki³

et al.

Abstract: A post-production characterization approach based on spectral photometric and ellipsometric data related to a specially developed set of samples is proposed. Reliability of the approach is demonstrated.

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Characterization of Electron-beam Deposited TiO2/SiO2 Coatings Based on Multi-Sample Photometric and Ellipsometric Data

Abstract: A post-production characterization approach based on spectral photometric and ellipsometric data related to a specially developed set of samples is proposed. Reliability of the approach is demonstrated.

Cited by 0 publications

References 2 publications

No citations

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