Characterization of directionally recrystallized cold-rolled nickel using EBSP

Abstract

Scanning electron microscopy (SEM) and electron back-scattered diffraction patterns (EBSP) have been employed to investigate the changes in the microstructure and texture of 90 % cold-rolled nickel when subjected to directional recrystallization. The effects of annealing temperature, hot zone velocity, and temperature gradient ahead of the hot zone on the microstructure were investigated.