2013
DOI: 10.1088/1742-6596/476/1/012101
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Characterization of dielectric properties of polycrystalline aluminum nitride for high temperature wireless sensor nodes

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“…In addition, the commercial importance of AlN stems from its high thermal conductivity, and relatively low permittivity, which makes it enticing as a substrate material for microelectronic devices, especially suitable for wireless passive sensing applications [ 3 , 4 , 5 , 6 ]. The most accurate methods of measuring low loss dielectric materials are resonance methods employing cavity perturbation technique [ 7 , 8 , 9 ], surface acoustic wave devices [ 10 ] or Lamb wave resonators [ 11 ], and dielectric resonance technique [ 12 , 13 , 14 ], mainly based on post resonance, cylinder cavity resonance and waveguide reflection resonance.…”
Section: Introductionmentioning
confidence: 99%
“…In addition, the commercial importance of AlN stems from its high thermal conductivity, and relatively low permittivity, which makes it enticing as a substrate material for microelectronic devices, especially suitable for wireless passive sensing applications [ 3 , 4 , 5 , 6 ]. The most accurate methods of measuring low loss dielectric materials are resonance methods employing cavity perturbation technique [ 7 , 8 , 9 ], surface acoustic wave devices [ 10 ] or Lamb wave resonators [ 11 ], and dielectric resonance technique [ 12 , 13 , 14 ], mainly based on post resonance, cylinder cavity resonance and waveguide reflection resonance.…”
Section: Introductionmentioning
confidence: 99%