2017
DOI: 10.1155/2017/4198519
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Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy

Abstract: Nanocomposites physical properties unexplainable by general mixture laws are usually supposed to be related to interphases, highly present at the nanoscale. The intrinsic dielectric constant of the interphase and its volume need to be considered in the prediction of the effective permittivity of nanodielectrics, for example. The electrostatic force microscope (EFM) constitutes a promising technique to probe interphases locally. This work reports theoretical finite-elements simulations and experimental measurem… Show more

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Cited by 20 publications
(16 citation statements)
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“…3), the signal between the compared samples should be similar in the absence of an interphase, whereas the Al 2 O 3 interphase is expected to strengthen the signal, confirming the contribution of an additional layer with a higher permittivity than that of the PS + SiO 2 sample. Indeed, as deduced from [28] and mentioned earlier, when the EFM signal increases in the presence of a thicker layer at the same tip–sample distance, this indicates that the added material possesses a dielectric permittivity higher than that of the initial particle + shell assembly. Although in our comparisons the added material was not at the surface but in the middle, the principle was the same [38].…”
Section: Resultssupporting
confidence: 57%
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“…3), the signal between the compared samples should be similar in the absence of an interphase, whereas the Al 2 O 3 interphase is expected to strengthen the signal, confirming the contribution of an additional layer with a higher permittivity than that of the PS + SiO 2 sample. Indeed, as deduced from [28] and mentioned earlier, when the EFM signal increases in the presence of a thicker layer at the same tip–sample distance, this indicates that the added material possesses a dielectric permittivity higher than that of the initial particle + shell assembly. Although in our comparisons the added material was not at the surface but in the middle, the principle was the same [38].…”
Section: Resultssupporting
confidence: 57%
“…However, surprisingly, the EFM signal was higher with SiO 2 than with Al 2 O 3 , although the SiO 2 permittivity is lower than that of Al 2 O 3 (3.9 for SiO 2 and 9.8 for Al 2 O 3 ) [34,36,41]. As Al 2 O 3 shells have already been well characterized in the previous sections and also in [28] and showed predictable performance, this abnormal dielectric response could be attributed to SiO 2 .…”
Section: Resultsmentioning
confidence: 77%
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