2014 IEEE 16th Electronics Packaging Technology Conference (EPTC) 2014
DOI: 10.1109/eptc.2014.7028390
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Characterization of dicing tape adhesion for ultra-thin die pick-up process

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Cited by 3 publications
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“…Handling thin dies requires extra attention to ensure the reliability and quality of semiconductor products [6] [10]. In fact, the situation is worsening in recent years because the dies have been thinning increasingly [11]. During the back-grinding process, finished wafer thickness varies on the basis of dry polishing parameters used, and such variations in finished thickness significantly affect the die strength, especially for 75 µm wafer [12].…”
Section: Introductionmentioning
confidence: 99%
“…Handling thin dies requires extra attention to ensure the reliability and quality of semiconductor products [6] [10]. In fact, the situation is worsening in recent years because the dies have been thinning increasingly [11]. During the back-grinding process, finished wafer thickness varies on the basis of dry polishing parameters used, and such variations in finished thickness significantly affect the die strength, especially for 75 µm wafer [12].…”
Section: Introductionmentioning
confidence: 99%