Characterization of contacts produced using a laser ablation/inkjet one step interconnect process for thin film photovoltaics

Abstract

A new laser ablation/inkjet process has been developed for the interconnect of thin film photovoltaic modules. This process involves laser ablation and inkjet printing of insulator and conductor materials carried out with high precision. Any error will compromise the device efficiency by increasing the series resistance or by causing shunting effects. Here we present a way of characterizing these interconnects using Scanning White Light Interferometry (SWLI). The SWLI technique allows the precise measurement of the laser scribe profile. We also present the use of a transmission line method (TLM) for the measurement of the contact resistance between the inkjet silver conductor and the Transparent Conducting Oxide.