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1986
DOI: 10.1351/pac198658030455
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Characterization of commercially available PAN (polyacrylonitri1e)-based carbon fibers

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Cited by 150 publications
(65 citation statements)
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“…The spectrum (a) refers to CF electrode with a profile graphite-like material [26,27] , showing two bands: D (~1352 cm −1 ), G (~1582 cm −1 ). Nonetheless, the spectrum (a) is compatible with PAN-based CF, i.e., it is the structure of the carbon fibers obtained from polyacrylonitrile precursor graphitized at temperatures around 1000 °C [27][28][29] , as expected. For all composites analyzed, the spectra are dominated by the PAni spectrum and exhibit characteristic bands of conducting species, mainly CF/PAni-30.…”
Section: Resultssupporting
confidence: 61%
“…The spectrum (a) refers to CF electrode with a profile graphite-like material [26,27] , showing two bands: D (~1352 cm −1 ), G (~1582 cm −1 ). Nonetheless, the spectrum (a) is compatible with PAN-based CF, i.e., it is the structure of the carbon fibers obtained from polyacrylonitrile precursor graphitized at temperatures around 1000 °C [27][28][29] , as expected. For all composites analyzed, the spectra are dominated by the PAni spectrum and exhibit characteristic bands of conducting species, mainly CF/PAni-30.…”
Section: Resultssupporting
confidence: 61%
“…Those used in connection with XPS analysis of CF and/or composite materials are scanning electron microscopy microscopy (TEM),23 atomic force microscopy (AFM),38 electron energy-loss spectroscopy (EELS), 23 Raman spectro~copy,~~ ion scattering spectroscopy (ISS),31 photoacoustic or diffuse reflectance Fourier transform infrared spectroscopy (PAS-FTIR or DRIFT, Auger electron spectroscopy (AES),33 x-ray diffraction 0(RD),34,43*44,46 and secondary ion mass spectroscopy (SIMS).39…”
Section: Multi-technique Approachmentioning
confidence: 99%
“…These studies * Author to whom correspondence should be addressed. and differential scanning ~a l o r i m e t r y~~ and scanning electron microscopy (see, for example, Refs 3,8,23,29,31,32 and 37). However, the most widely adopted technique for C F characterization is x-ray photoelectron spectroscopy (XPS), which was used to study the effect the interaction of CF with thin resin films,27 the structural changes during PAN carbonization,' 8 9 4 9 the removal of sizing from the fibre surface,50 the surface microporosity of CF,51 the effects of hydrothermal exposure52 and fibre finish53 on fibre-matrix adhesion and the effects of ion bombardment on C F and graphitic materials.…”
Section: Introductionmentioning
confidence: 99%