2004
DOI: 10.1002/sia.1995
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Characterization of cathodic film formed during reduction of chromic acid: role of sulphuric acid concentration

Abstract: The surface composition of chromium, electrodeposited from a chromic acid solution with different amounts of sulphuric acid, has been investigated by means of Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS). The quantity of sulphuric acid is a critical parameter in order to form metallic chromium instead of a non-reducible chromium (III) oxide layer. The intermediate cathodic film formed on the electrode before the metallic chromium deposition has been investigated and XPS measurem… Show more

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