2018
DOI: 10.1063/1.5032352
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Characterization of aluminum selenide bi-layer thin film

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Cited by 3 publications
(6 citation statements)
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“…The optical curve was reported between 35 and 100 °C. [135] The calculated bandgap (using a 1:1 ratio, in the range of temperature specified) was around 2.1 eV (Figure 9). Adams et al, [136] have reported the formation of a stable heterojunction of AlSe onto Si(111) using molecular beam epitaxy, and with the hypothesis of depositing Al 2 Se 3 onto Si, they discovered that the structure that forms is indeed AlSe.…”
Section: Physical Propertiesmentioning
confidence: 98%
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“…The optical curve was reported between 35 and 100 °C. [135] The calculated bandgap (using a 1:1 ratio, in the range of temperature specified) was around 2.1 eV (Figure 9). Adams et al, [136] have reported the formation of a stable heterojunction of AlSe onto Si(111) using molecular beam epitaxy, and with the hypothesis of depositing Al 2 Se 3 onto Si, they discovered that the structure that forms is indeed AlSe.…”
Section: Physical Propertiesmentioning
confidence: 98%
“…Long times of purge, in thermal ALD, are impractical if the thickness required is large. Boolchandani et al [135] have studied the formation of Al-Se thin layer and reported both bilayer and multilayer films.…”
Section: Physical Propertiesmentioning
confidence: 99%
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“…Despite the fact that semiconducting chalcogenide glasses (SCGs) were discovered a long time ago (in 1956), they are still attracting considerable interest, with the focus mainly being on the electrical and optical properties of thin noncrystalline SCG films [1][2][3].…”
Section: Introductionmentioning
confidence: 99%