2019
DOI: 10.1021/acs.jpcc.9b05744
|View full text |Cite
|
Sign up to set email alerts
|

Characterization and Reversible Migration of Subsurface Hydrogen on Rutile TiO2(110) by Atomic Force Microscopy at 78 K

Abstract: In this study, we have systematically characterized and reversibly manipulated the subsurface hydrogen (H sub ) on rutile TiO 2 ( 110)-(1 × 1) by a combination of noncontact atomic force microscopy, scanning tunneling microscopy, and Kelvin probe force microscopy at 78 K. Four different configurations of the H sub , including the monomer, dimer, trimer, and tetramer, are clearly characterized and discriminated by simultaneous atomic force microscopy and scanning tunneling microscopy measurements. Specifically,… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

0
7
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 8 publications
(9 citation statements)
references
References 65 publications
0
7
0
Order By: Relevance
“…The two hydrogen atoms form a water configuration including O ad 2− and the adjacent O s atoms. The characteristics of a net positively charged hydrogen atom were previously well accepted by various experimental techniques 1 23 , 26 , 30 , 34 , 44 . Two black spots that correspond to bistable O s H defects can be observed in Fig.…”
Section: Resultsmentioning
confidence: 90%
See 4 more Smart Citations
“…The two hydrogen atoms form a water configuration including O ad 2− and the adjacent O s atoms. The characteristics of a net positively charged hydrogen atom were previously well accepted by various experimental techniques 1 23 , 26 , 30 , 34 , 44 . Two black spots that correspond to bistable O s H defects can be observed in Fig.…”
Section: Resultsmentioning
confidence: 90%
“…Finally, we demonstrate the capability of negative bias KPFS for the lateral manipulation of O s H defect on a rutile TiO 2 surface using an individual single O s H defect, because this O s H defect is also the most fundamental atomic feature on this surface 1 and known to provide a critical role in photocatalysis at tremendous condition 1 23 . Figure 6(a) shows an atomically resolved AFM image of a rutile TiO 2 (110) surface partially exposed to oxygen at room temperature obtained using a hole mode tip 9 , 30 , 34 .…”
Section: Resultsmentioning
confidence: 97%
See 3 more Smart Citations