2012
DOI: 10.1016/j.apsusc.2012.02.039
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Characterization and properties of amorphous carbon coatings prepared by middle frequency pulsed unbalanced magnetron sputtering at different substrate bias

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Cited by 13 publications
(7 citation statements)
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“…Roughness factors are 1.86 for Pt-C film and only 1.54 for Pt (close to the roughness factor for Pt foil, which equals 1.2-1.5). This is in a good agreement with data [29][30][31] that show that negative bias voltage application increases film density and improves hardness and adhesion. Catalytic activity of these films is low because their surface is not well developed (the roughness factor is low).…”
Section: Discussionsupporting
confidence: 92%
See 1 more Smart Citation
“…Roughness factors are 1.86 for Pt-C film and only 1.54 for Pt (close to the roughness factor for Pt foil, which equals 1.2-1.5). This is in a good agreement with data [29][30][31] that show that negative bias voltage application increases film density and improves hardness and adhesion. Catalytic activity of these films is low because their surface is not well developed (the roughness factor is low).…”
Section: Discussionsupporting
confidence: 92%
“…The structure and catalytic activity of the Pt and Pt-C films deposited by DC sputtering with negative bias voltage have minimal differences compared to those of films deposited using all other sputtering regimes. As was shown in [29] strong re-sputtering of deposited carbon atoms occurred at such a bias voltage. This explains the absence of microstructure dependence on target composition (in contrast to the case of DC sputtering without negative bias voltage).…”
Section: Discussionsupporting
confidence: 59%
“…The deconvolution of this peak allows quantifying the relative sp 2 and sp 3 bindings amount due to a slight difference in binding energy levels. [11,20,21]. Insuring a very low energy levels shift (less than 1%) between all our samples, we quantify sp 2 and sp 3 contribution values with a very good precision ( ± 0.5%).…”
Section: Characterization Techniquesmentioning
confidence: 83%
“…Under this deposition condition, the ion implantation is associated with a compressive stress and densification, which in turn leads to the increased fraction of the sp 3 C bond. In the condition of substrate bias, the energy of carbon ions that reach the substrate increases with the increase of substrate bias, and it has been found that the sp 3 content, hardness, and compressive stress in DLC films deposited by pulsed unbalanced magnetron sputtering increases with increasing substrate bias from 0 to 120 V . In the DLC films deposited with step biasing, a step increase of bias helps to reduce the residual stress due to the gradual variation of the sp 3 /sp 2 ratio, hardness and compressive stress, the soft and low‐stress DLC layer being susceptible to plastic deformation could act as a supporting layer to relieve the residual stress of the hard and high‐stress DLC layers .…”
Section: Resultsmentioning
confidence: 99%