2017
DOI: 10.1088/1748-0221/12/03/c03047
|View full text |Cite
|
Sign up to set email alerts
|

Characterization and optimization of a thin direct electron detector for fast imaging applications

Abstract: Characterization and optimization of a thin direct electron detector for fast imaging applications View the table of contents for this issue, or go to the journal homepage for more 2017 JINST 12 C03047

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
1
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
2
2

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(2 citation statements)
references
References 11 publications
(11 reference statements)
0
1
0
Order By: Relevance
“…Experimental results on electron energy deposits in thin silicon layers are reported in Meroli et al (2011), Dourki et al (2017. Table 5 summarizes the simulation results for deposited energy and minimum number of detectable electrons per second incident perpendicularly on the H-SPACE sensor surface.…”
Section: Electron Rate Detection Limitsmentioning
confidence: 99%
“…Experimental results on electron energy deposits in thin silicon layers are reported in Meroli et al (2011), Dourki et al (2017. Table 5 summarizes the simulation results for deposited energy and minimum number of detectable electrons per second incident perpendicularly on the H-SPACE sensor surface.…”
Section: Electron Rate Detection Limitsmentioning
confidence: 99%
“…The evaluation of the electron flux detection limits is based on FLUKA [45][46][47] simulations of the same 4x4x0.0082 mm 3 device crosschecked with experimental results of electrons crossing thin silicon layers [48,49]. Extending the sensor area to 20x20 mm 2 and using the whole spectral range of Fig.…”
Section: Electron Flux Detection Limitsmentioning
confidence: 99%