2015
DOI: 10.1007/s10854-015-3888-0
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Characterization and doping effects study of high hole concentration Li-doped ZnO thin film prepared by sol–gel method

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Cited by 14 publications
(6 citation statements)
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“…Due to the reduced O 2 region being relative to oxygen deficiency in the Li-doped ZnO thin films [32], it indicates the oxygen vacancies (V O ) were decreased compared with that in the pure ZnO thin film. Thus, the defects in the ZnO thin films were reduced by using the Li doping, effectively improving the quality of the film and square resistance [33,34].…”
Section: Methodsmentioning
confidence: 99%
“…Due to the reduced O 2 region being relative to oxygen deficiency in the Li-doped ZnO thin films [32], it indicates the oxygen vacancies (V O ) were decreased compared with that in the pure ZnO thin film. Thus, the defects in the ZnO thin films were reduced by using the Li doping, effectively improving the quality of the film and square resistance [33,34].…”
Section: Methodsmentioning
confidence: 99%
“…The decrease of near-band-edge (NBE) at around 376 nm is followed by the increase of deep-level (DL) emission is related to a radiative transition from donors to acceptors. As can be seen, the intensity of this peak decreased with lithium doping (5%), that can be attributed to filling some of Zn vacancies with Li 2+ substitutional, which leads to becoming intrinsic n-type ZnO to p-type [41] and has disappeared completely when the lithium atoms of insertion in the ZnO matrix for other lithium percentages of 5%; This behavior can be attributed to the increase of the non-radiative centers caused by the existence of strong valence of the lithium (Li 2+ ) [42]. The broad emission band located in the visible range (400-700 nm) is mainly due to point-like structural defects related to deep-level emissions, such as zinc vacancies, oxygen vacancies, interstitial zinc, and interstitial oxygen, with a shoulder yellow-orange emission.…”
Section: Pl Analysismentioning
confidence: 89%
“…3 приведена диаграмма зависимости параметров с и а кристаллической решетки ZnO от количества карбоната лития, вносимого в состав исходных смесей. Наблюдаемое значительное изменение параметра кристаллической решетки с при термообработке керамических образцов при 650 ºС может быть обусловлено снятием механических напряжений, формируемых в керамиках при искровом плазменном синтезе, а также различием величин ионных радиусов атомов Zn и Li, формированием сложных комплексов (например, Li Zn -Li i ) [8][9][10]. Согласно [11] уменьшение параметра а вызвано замещением цинка (ионный радиус 0,074 нм) в узлах решетки литием с его малым ионным радиусом (0,060 нм), а увеличение -содержанием лития в междоузлиях.…”
Section: результатыunclassified