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Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and
DOI: 10.1109/wcpec.1994.520212
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Characterization and analysis of multilayer solar cells

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Cited by 5 publications
(2 citation statements)
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“…1͒. 10 The topology of the surface influences the EBIC image due to the position-dependent generation volume in the pc-Si layers, 11 but the EBIC images clearly show more than only a topology contrast. 1 all result from epitaxial stacking faults along the ͑111͒ planes when looking at a ͑100͒ plane.…”
Section: Electrical Activity Of Intragrain Defects In Polycrystallinementioning
confidence: 99%
“…1͒. 10 The topology of the surface influences the EBIC image due to the position-dependent generation volume in the pc-Si layers, 11 but the EBIC images clearly show more than only a topology contrast. 1 all result from epitaxial stacking faults along the ͑111͒ planes when looking at a ͑100͒ plane.…”
Section: Electrical Activity Of Intragrain Defects In Polycrystallinementioning
confidence: 99%
“…These processes are directly applicable to polycrystalline thin-film silicon solar cells, as evidenced by recent reports of a 16.45%-efficient, thinned-silicon solar cell," a 17.3%-efficient thin-film layer grown epitaxially by atmospheric pressure chemical vapor deposition on a highly-doped silicon substrate," a 15.7%-efficient thin-film layer grown from the liquid phase on a highly-doped silicon substrate" and a 15.2~<)-efficient, thin, multiple-interleaved solar cell structure. 5 This paper reviews our approach to developing a thin-film, polycrystalline, silicon solar cell technology. Recent efforts toward the development of advanced thin-film silicon solar cell products will also be discussed.…”
mentioning
confidence: 99%