The photoconductivity (PC) of TlGaS2 layered single crystals was investigated in the 77−300 K temperature,
1000−2500 lx excitation intensity, 10−25 V applied voltage, and 415−535 nm wavelength ranges. Both the
alternating current photoconductivity (ac-PC) and the spectral distribution of the photocurrent were studied
at different values of light intensity, applied voltage, and temperature. Dependencies of the carrier lifetime
on light intensity, applied voltage, and temperature have been investigated as a result of the ac-PC and direct
current photoconductivity (dc-PC) measurements. The temperature dependence of the energy gap width was
described as a result of studying the dc-PC. The values of the photoconductivity response time, which are
reported from the light intensity dependence of ac-PC, presents that there is a continuous distribution of traps
in the energy gap.