Characteristics of noise degradation and recovery in gamma-irradiated SOI nMOSFET with in-situ thermal annealing

Amor, Sarra Ben; Kilchytska, Valeriya; Tounsi, Farès; André, Nicolás; Machhout, Mohsen; Francis, Laurent; Flandre, Denis

doi:10.1016/j.sse.2022.108300

Solid-State Electronics

2022

DOI: 10.1016/j.sse.2022.108300

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Characteristics of noise degradation and recovery in gamma-irradiated SOI nMOSFET with in-situ thermal annealing

Sarra Ben Amor

Valeriya Kilchytska

Farès Tounsi

et al.

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Characteristics of noise degradation and recovery in gamma-irradiated SOI nMOSFET with in-situ thermal annealing

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References 18 publications

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