Abstract:Thermally evaporated Bi2Te2.45Se0.55 thin films were examined for structural alterations and electrical conductivity. Crystallite size, micro-strain, and dislocations were all calculated using the XRD data. By using transmission electron microscopy, the morphology of thin films was investigated (TEM). The study was performed within a temperature range of (300 – 500) K. The electrical energy gap and the conductivity of the as-deposited and annealed (373, 473K) Bi2Te2.45Se0.55 films were measured. The obtained v… Show more
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