Characterisation of the Shunt Resistance due to Potential Induced Degradation (PID) in Crystalline Solar Cells

Florides, Michalis; Makrides, George; Georghiou, George E.

doi:10.1109/pvsc.2018.8547500

Cited by 8 publications

(2 citation statements)

References 5 publications

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“…3,13) At the same time, a steep decrease of the shunt resistance (R sh ) occurs. 14) There are currently two widely used test methods for simulating the PID phenomenon. 6,[15][16][17] One is the chamber method for PID testing in which a high voltage is applied to the PV module at high temperature and humidity, as described in IEC 62804-1.…”

Section: Introductionmentioning

confidence: 99%

Potential-induced degradation phenomena in single-encapsulation crystalline Si photovoltaic modules

Qin,

Yonemoto,

Gotoh

et al. 2023

Jpn. J. Appl. Phys.

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This paper particularly explains potential-induced degradation (PID) of wafer-based standard p-type crystalline silicon technology. We present a single-encapsulation method that is useful for simulating PID in the laboratory to facilitate microanalyses of module-level solar cells. The PID testing is performed for the module with single-encapsulation and conventional modules. Their current–voltage characteristics and electroluminescence images are investigated before and after the PID tests. As described herein, we infer that the single-encapsulation modules generate PID almost in the same way as conventional modules do, and that the degradation trend is almost identical to that of conventional modules. Results of PID recovery tests indicate that the time necessary for PID recovery is always less than that for PID generation, irrespective of the encapsulation method.

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Section: Introductionmentioning

confidence: 99%

Potential-induced degradation phenomena in single-encapsulation crystalline Si photovoltaic modules

Qin,

Yonemoto,

Gotoh

et al. 2023

Jpn. J. Appl. Phys.

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“…However, for the diagnosis of large photovoltaic arrays, the only option is to use thermography in combination with a drone to at least briefly identify the defective modules. As follows from [10][11][12][13], in addition to the above methods, it is also possible to detect PID by changes in the dark I-V curves of the modulus, also called forward DC resistance (FDCR), or by impedance spectroscopy [14][15][16]. These methods require relatively less expensive equipment and can be used in situ.…”

Section: Introductionmentioning

confidence: 99%

Diagnostics of PID Early Stage in PV Systems

et al. 2021

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Potential induced degradation (PID) is a serious threat for the photovoltaic (PV) industry. The risk of PID may increase with increasing operating voltage of PV systems. Although PID tests are currently standard tests, the expansion of floating PV power plants and installation in humid climates show that PID-free modules are still sensitive to this type of degradation. Therefore, a method that can detect PID in the initial phase before standard tests reveal it, is necessary to increase the reliability of PV systems and maintain their lifetime. One possible tool for revealing early-stage PID manifestations is impedance spectroscopy and I-V dark curves measurements. Both IS and dark current measurement methods are sensitive to cell shunt resistance (RSH), which is strongly influenced by PID before significant power loss and can act as an early stage PID detection mechanism. The paper describes the differences of the common P-type PV module parameters both during the degradation process and also during the regeneration process when diagnosed by conventional and IS and dark current measurement methods.

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Determining solar cell parameters and degradation rates from power production data

Chakar

Pavlov²,

Bonnassieux³

et al. 2022

Energy Conversion and Management: X

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Characterisation of the Shunt Resistance due to Potential Induced Degradation (PID) in Crystalline Solar Cells

Cited by 8 publications

References 5 publications

Potential-induced degradation phenomena in single-encapsulation crystalline Si photovoltaic modules

Potential-induced degradation phenomena in single-encapsulation crystalline Si photovoltaic modules

Diagnostics of PID Early Stage in PV Systems

Determining solar cell parameters and degradation rates from power production data

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