British and Irish Conference on Optics and Photonics 2023 2023
DOI: 10.1364/bicop.2023.th4b.4
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Characterisation of Mode Field Diameter for “Quantum-Grade” Interconnects

R. A. Ferguson,
J. Felix,
S. R. G. Hall

Abstract: The paper describes the characterization of “quantum-grade” interconnects using Mode Field Diameter as a figure of merit. We discuss the metrology needs for Quantum Network interconnects, supporting the development of commercially relevant traceable standards.

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