2019
DOI: 10.1017/s1431927619010316
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Characterisation of Misfit Dislocations at Semicoherent Interfaces in Biphasic Functional Heusler Intermetallics

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“…In the top grain, we can see the long axis of the ellipsoidal-shaped precipitates (similar precipitate shapes are reported by Kimuro et al [18]), highlighting their high aspect ratio. The long axis can extend to more than 10 μm and the short axis is in the range of 500 nm, shown in the magnified high angle annular dark field (HAADF) STEM images acquired after having oriented the sample in zone axis in Figure 1c and HH phases with different lattice parameters [26]. This is confirmed by the complementary selected area electron diffraction (SAED) pattern of zone axis [111] shown in Figure 1f.…”
Section: Precipitate Morphologymentioning
confidence: 62%
“…In the top grain, we can see the long axis of the ellipsoidal-shaped precipitates (similar precipitate shapes are reported by Kimuro et al [18]), highlighting their high aspect ratio. The long axis can extend to more than 10 μm and the short axis is in the range of 500 nm, shown in the magnified high angle annular dark field (HAADF) STEM images acquired after having oriented the sample in zone axis in Figure 1c and HH phases with different lattice parameters [26]. This is confirmed by the complementary selected area electron diffraction (SAED) pattern of zone axis [111] shown in Figure 1f.…”
Section: Precipitate Morphologymentioning
confidence: 62%