2015
DOI: 10.1049/mnl.2015.0038
|View full text |Cite
|
Sign up to set email alerts
|

Characterisation of ferroelectric poly(vinylidene fluoride–trifluoroethylene) film prepared by Langmuir‐Blodgett deposition

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2016
2016
2022
2022

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 16 publications
0
1
0
Order By: Relevance
“…156 The LB method has found to produce nanoscale films of pure and oriented β phase PVDF and PVDF-TrFE. 154,155 These films have been well-characterized in terms of their compositional 157 , optical 154 , morphological 154,158,159 and piezoelectric 154,159 properties. PVDF-TrFE thin films produced by the LB technique show a quasi-monolayer formation behavior, approximately 3.5 nm in thickness and a RMS roughness of 3.1 nm for one layer.…”
Section: Reviewmentioning
confidence: 99%
“…156 The LB method has found to produce nanoscale films of pure and oriented β phase PVDF and PVDF-TrFE. 154,155 These films have been well-characterized in terms of their compositional 157 , optical 154 , morphological 154,158,159 and piezoelectric 154,159 properties. PVDF-TrFE thin films produced by the LB technique show a quasi-monolayer formation behavior, approximately 3.5 nm in thickness and a RMS roughness of 3.1 nm for one layer.…”
Section: Reviewmentioning
confidence: 99%