2005
DOI: 10.1016/j.snb.2005.03.008
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Characterisation and stabilisation of Pt/TaSi /SiO2/SiC gas sensor

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Cited by 11 publications
(5 citation statements)
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“…The Ni layer forms an ohmic contact [24,25] with the heavily doped substrate and the Pt coating protected the Ni layer from the hazardous environment. A detailed description of this fabrication process has been published elsewhere [26]. After their fabrication the devices were annealing for some hours in an alternating reducing and oxidizing atmospheres at temperatures above 600 • C in order to obtain a suitable porosity of the gate layer [27] and stabilize the electrical behavior of the devices at high temperatures.…”
Section: Methodsmentioning
confidence: 99%
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“…The Ni layer forms an ohmic contact [24,25] with the heavily doped substrate and the Pt coating protected the Ni layer from the hazardous environment. A detailed description of this fabrication process has been published elsewhere [26]. After their fabrication the devices were annealing for some hours in an alternating reducing and oxidizing atmospheres at temperatures above 600 • C in order to obtain a suitable porosity of the gate layer [27] and stabilize the electrical behavior of the devices at high temperatures.…”
Section: Methodsmentioning
confidence: 99%
“…After their fabrication the devices were annealing for some hours in an alternating reducing and oxidizing atmospheres at temperatures above 600 • C in order to obtain a suitable porosity of the gate layer [27] and stabilize the electrical behavior of the devices at high temperatures. This post-fabrication treatment not only transforms physically the metallic gate layer but yields to an oxidation of the deposited TaSi x layer to Ta 2 O 5 and several tantalum sub-oxides and a small quantity of SiO x [26] that obviously result in different electrical characteristics with respect those of the as-fabricated devices. The final layer structure of the MIS capacitors is schematized in Fig.…”
Section: Methodsmentioning
confidence: 99%
“…) grown on heavily doped substrate (0.021Ω) purchased from CREE Inc. A detailed description of the fabrication process can be found elsewhere [7,11]. After their fabrication, the devices were annealed in alternating reducing and oxidizing atmospheres at temperatures above 600ºC for at least 2 hours in order to obtain a porous gate layer with stable electrical properties [3].…”
Section: Methodsmentioning
confidence: 99%
“…In these applications, SiC's characteristic properties, such as a high melting temperature, high thermal conductivity, high Young modulus, wide energy band gap, and chemical stability are fully exploited [1][2][3]. In particular, metal/SiC Schottky diodes are used in the fabrication of different devices, ranging from high-temperature and -power electronics to very sensitive high-temperature hydrogen and hydrocarbon gas detectors and biosensors (due to SiC's biocompatibility properties) [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15]. So, in the last few decades, to meet specific technological requirements, various methodologies were exploited for the fabrication of metal/SiC diodes.…”
Section: Introductionmentioning
confidence: 99%