2019
DOI: 10.1007/s11340-019-00534-y
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Channel Cracking and Interfacial Delamination of Indium Tin Oxide (ITO) Nano-Sized Films on Polyethylene Terephthalate (PET) Substrates: Experiments and Modeling

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Cited by 12 publications
(6 citation statements)
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“…The failure of thin film composite materials mainly involves the propagation of microcracks under tension. At present, cohesive fracture and interface delamination are considered the main failure modes of thin film materials [19] . Cohesive fracture is the cracking of brittle films under tension, commonly known as channel fracture.…”
Section: Film Fracture Mechanismmentioning
confidence: 99%
“…The failure of thin film composite materials mainly involves the propagation of microcracks under tension. At present, cohesive fracture and interface delamination are considered the main failure modes of thin film materials [19] . Cohesive fracture is the cracking of brittle films under tension, commonly known as channel fracture.…”
Section: Film Fracture Mechanismmentioning
confidence: 99%
“…Indium tin oxide (ITO) thin film stands out as the earliest and most widely used transparent conductive oxide, boasting high conductivity, visible light transmittance, and excellent etching properties . Despite its advantages, ITO requires high processing temperatures for crystallization to exhibit optimal photoelectric performance and is prone to cracking under stress, limiting its application in flexible devices. , Consequently, various flexible conductive materials have been developed, including carbon-based conductive films like carbon nanotubes and graphene, metal-based conductive films such as nanowires and ultrathin metal films, and organic polymer conductive films . While these alternatives offer exceptional flexibility, practical challenges such as the high cost of preparing graphene films and the susceptibility of metal counterparts to oxidation must be addressed …”
Section: Introductionmentioning
confidence: 99%
“…The optimal processing conditions with high removal rate, low non-uniformity, low resistivity, and high transmittance were obtained. Ziaei et al [25] explained the failure behaviors of layered film systems, such as channel cracking and interfacial delamination, by using a combination of nonlinear finite element method, dislocation-density crystalline plasticity model, and viscoelastic formulation. Wang et al [26] obtained mechanical performance data such as hardness, elastic modulus, energy release rate, and fracture toughness of ITO thin film materials through nanoindentation tests.…”
Section: Introductionmentioning
confidence: 99%