Change-point analysis of the failure mechanisms based on accelerated life tests

For high-reliability and long-life electronic devices, reliability analyses based on degradation data with small sample sizes are an outstanding question. Recently, increasing attention has been paid to the abundant historical degradation data. Exploiting the information in these historical data efficiently and integrating them to benefit the current reliability analysis is an important issue. This study proposes a new integrating method for the historical and current degradation data based on the Wiener process by considering the consistency of failure mechanisms between the different batches of degradation data. Simulation studies show that the new method has superior reliability estimation, and is robust to the assumption of consistent failure mechanisms. Finally, the proposed method is used to analyze a real data set consisting of the metal-oxide-semiconductor field-effect transistor (MOSFET) degradation data.

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“…In this work, the on‐resistance is adopted as the degradation indicator follows Cai et al 31 . and Zheng et al 32 ,.…”

Section: Real Data Analysismentioning

confidence: 99%

“…In this work, the on-resistance is adopted as the degradation indicator follows Cai et al 31 and Zheng et al 32 , and the linear Wiener process model is considered in this case. The failure threshold 𝑄 is 1.2 times the initial degradation value.…”

Section: Real Data Analysismentioning

confidence: 99%

Reliability analysis based on the Wiener process integrated with historical degradation data

Kang

Tian

et al. 2023

Quality & Reliability Eng

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“…According to Equation (17), the CMADT value ρ = [ρ L , ρ U ] can be obtained for all n test points, i.e.,…”

Section: Single Key Parameter Of the Overall Confidence Evaluationmentioning

confidence: 99%

“…The variation in the shape of the parameters in the Arrhenius model also provides a way to explore the consistency of the failure mechanism [16]. Cai et al [17] proposed a change-point model for the coefficients of variation to fit the abrupt change behavior of the failure mechanisms with a nonparametric empirical likelihood approach, which was used in the lifetime data of the metal oxide semiconductor transistors in the power distribution system of the Chinese Tiangong space station. Zhai et al [18] proposed a method for consistency testing of ADT (accelerated degradation test) failure mechanisms based on the activation energy invariance method and the likelihood ratio test, accounting for the degradation dispersion caused by the manufacturing technology.…”

Section: Introductionmentioning

confidence: 99%

A Novel Model Validation Method Based on Area Metric Disagreement between Accelerated Storage Distributions and Natural Storage Data

et al. 2023

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It has been a challenge to quantify the credibility of the accelerated storage model until now. This paper introduces a quantitative measurement named the CMADT (Creditability Metric of Accelerated Degradation Test), which quantifies the credibility of the accelerated aging model based on available data. The relevant criterion data are obtained from the natural storage test. CMADT is a credibility metric obtained by measuring the difference in the metric area between the probability distribution of the accelerated storage model and its criterion data. In addition, the accelerated aging model might include multiple parameters resulting in several single-parameter CMADTs. This paper proposes a method that integrates several single-parameter CMADT metrics into a single metric to assess the overall credibility of the accelerated storage model. Moreover, CMADT is universal for different scales of sample data. The cases addressed in this paper show that CMADT helps designers and decision-makers judge the credibility of the result obtained by the accelerated storage model intuitively and makes it easier to compare various products horizontally.

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“…At present, research on ALT and ADT focuses on stochastic process modeling [10]- [12], experimental optimization design [13]- [19] and engineering applications of ALT and ADT [20]- [23]. The key points in ALT and ADT modeling are acceleration model selection [24], mechanism consistency verification [25]- [28] and model parameter estimation [29]. Commonly used acceleration models include Arrhenius model, Eyring model, inverse power model and polynomial model [24].…”

Section: Introductionmentioning

confidence: 99%

Performance Degradation Prediction and Reliability Evaluation of Rubber Aging in Natural Environment Under Alternating Cyclic Thermal Load

Liu

Shi

et al. 2019

IEEE Access

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With a focus on predicting the degradation of rubber performance in the natural environment and evaluating its reliability, the distribution law of accelerated aging life is analyzed through the accelerated aging test of hot oxygen. A Weibull distribution model is then established to verify the consistency of the accelerated aging mechanism. Through the constant stress accelerated aging test data, the aging characteristics of the rubber under alternating thermal stress load in the natural environment are inferred. The concept of thermal stress amplitude coefficient is proposed, and its numerical value is calculated by the combination of numerical simulation and single-peak curve fitting. Under the principle of time-temperature equivalence, the segmentation time equivalent method and the overall temperature equivalent method are employed to calculate the rubber performance degradation curve under natural environment aging conditions. Finally, according to the Weibull distribution, the aging reliability of the rubber over time is simulated. This research can provide a reference for the aging reliability evaluation of products under alternating stress.INDEX TERMS Rubber, natural aging, alternating stress, thermal stress amplitude coefficient, Weibull distribution, reliability.

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Change-point analysis of the failure mechanisms based on accelerated life tests

Cited by 18 publications

References 20 publications

Reliability analysis based on the Wiener process integrated with historical degradation data

Reliability analysis based on the Wiener process integrated with historical degradation data

A Novel Model Validation Method Based on Area Metric Disagreement between Accelerated Storage Distributions and Natural Storage Data

Performance Degradation Prediction and Reliability Evaluation of Rubber Aging in Natural Environment Under Alternating Cyclic Thermal Load

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