Challenging Terabit-Class LAN Over Wide Area Networks

Ishida, Osamu; Araki, Satoshi

doi:10.1109/jlt.2009.2022486

Cited by 8 publications

(3 citation statements)

References 13 publications

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“…The significant technological advantages of optical links have lead to development of all levels of communication from long-haul trunk telephony down to local area networks (e.g. Ishida and Araki, 2009;Park et al, 2007). A schematic presentation of such a network is shown in Figure 1 (Nortel Networks, 2001).…”

Section: Introductionmentioning

confidence: 99%

“…Optical fibre technology has also spread into local area networks (LANs) such as IEEE (Cunningham and Nowell, 1997), storage area networks (SANs) (Fu et al, 2008;Weiner, 2003), wide area networks (Ishida and Araki, 2009) and sensor applications to name but a few (Ferna´ndez et al, 2009;Vaezi-Nejad, 2000). The national standard for temporal and frequency response measurements of optoelectrical devices has a focus on noise measurements of laser diodes, primarily to serve the needs of the optical telecommunications industry, and particularly long-haul communications links and cable television (DTI/NSPU, 1994).…”

Section: Introductionmentioning

confidence: 99%

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Novel instrumentation for measurement of relative intensity noise

Vaezi-Nejad

Cox²,

Cooper³

2011

Transactions of the Institute of Measurement and Control

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Laser diode relative intensity noise (RIN) metrology capabilities have been developed and demonstrated, providing significantly improved sensitivity and accuracy compared with existing methods. The novel use of the demonstrated reference noise source has shown significant advantages, achieving improved sensitivity, reducing measurement accuracy as low as ±1 dB and simplifying the system calibration methodology, thus improving flexibility. Laser RINs of between 10 and 14 dB below the shot RIN have been shown (typically −170 dBm/Hz), which is a direct result of the improved system sensitivity. A neodinium yag 1319-nm ring laser provided a ‘cold’ reference source, in a similar manner to that used in RF electrical metrology. Application of the ‘flat’ low noise optical RF noise source from 10 MHz to 20 GHz has been demonstrated for the first time in optical RF metrology, providing a calculable reference traceable via the incident optical power received. Because of the simplistic nature of this approach, system calibration can be performed for each RIN measurement that is carried out, reducing measurement uncertainty associated with RF mismatch, system linearity and loss. High specification components have been assessed individually and in the combined system indicating an overall system noise figure of 2–3 dB over the 10 MHz to 20 GHz frequency range (−171 to −172 dBm), some 4–5 dB better than previously reported.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Novel instrumentation for measurement of relative intensity noise

Vaezi-Nejad

Cox²,

Cooper³

2011

Transactions of the Institute of Measurement and Control

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“…Optical interfaces for over 10Gbps are another part of the trend to parallel processing, and 40Gbps Ethernet and 100Gbps Ethernet standards are adopting some form of parallel physical layer connections. Our research target is to realize the terabit-scalable end-to-end parallel networking architecture called TLAN [1][2][3]. TLAN uses the concepts of multi-rail and multi-lane.…”

Section: Introductionmentioning

confidence: 99%