2015
DOI: 10.1016/j.elspec.2015.05.002
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Challenges in the characterization of plasma polymers using XPS

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Cited by 41 publications
(30 citation statements)
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References 140 publications
(207 reference statements)
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“…Three small peaks are found in the binding energy range of 286–292 eV. The peak at 286.9 eV represents CO bonds that are probably associated with epoxy groups, formed from the reaction between vinyl groups and peroxy radicals . Ether groups generated during the addition of tert ‐butoxy radicals to vinyl moieties are also likely to contribute to broad peak at 286.9 eV.…”
Section: Resultsmentioning
confidence: 99%
“…Three small peaks are found in the binding energy range of 286–292 eV. The peak at 286.9 eV represents CO bonds that are probably associated with epoxy groups, formed from the reaction between vinyl groups and peroxy radicals . Ether groups generated during the addition of tert ‐butoxy radicals to vinyl moieties are also likely to contribute to broad peak at 286.9 eV.…”
Section: Resultsmentioning
confidence: 99%
“…A representative high resolution C1s XPS spectrum of the cross-section of a 10 mm wide foam strip, after a deposition time of 30 min, is shown in Figure 4a, while curve-fitting results are reported in Table 1. The C1s signal is curve-fitted with the typical components ascribed to the fluorinated groups of a plasma-deposited fluorocarbon coating, [12,17,18] and specifically, the peaks at 286.8 AE 0. is also included (about 4% peak area) and could be due to both the underlying PU substrate and adventitious carbon. The possible substrate contribution to the C1s signal suggests that either the thickness of the deposited film is close to the sampling depth of XPS (4-10 nm) or that during sample preparation (i.e., sample cutting after plasma treatment) some untreated material was inevitably exposed and/or some damage of the coating occurred.…”
Section: Resultsmentioning
confidence: 99%
“…Spectra were acquired using an Mg anode (1,253.6 eV) operating at 300 W. The pass energy was set to 100 eV for survey spectra (not presented here), and 20 eV for high‐resolution (HR) C 1 s peak shape analysis. The HR C 1 s peak fitting was performed using CasaXPS (CasaSoftware Ltd), by considering the lowest number of physically meaningful components; for the sake of clarity, these were restricted to the “first neighbor”‐induced chemical shift (C–C/C–H, C–N/C‐O, C*‐CF x , C–F, C–F 2 ) . The FWHM (20 eV pass energy) of these components was constrained to 1.8 ± 0.1 eV, and binding energies were charge‐referenced by setting the hydrocarbon (C–C/C–H) component to 285.0 eV. …”
Section: Methodsmentioning
confidence: 99%