2000
DOI: 10.1016/s0026-2692(99)00140-8
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CF4 plasma etching of materials used in microelectronics manufacturing

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Cited by 26 publications
(17 citation statements)
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“…This result shows that NaOH is a superior resist material compared with the normally used AZ photoresists which have about 0.3-0.7 times faster etching speeds (under CF 4 plasma) than Si. [33] The etching property of NaOH was further utilized for fabricating micropatterned Si with nanoz /µm z /nm : 4 lm). b) 3D AFM image of (a) and its corresponding cross-sectional analysis.…”
Section: Resultsmentioning
confidence: 99%
“…This result shows that NaOH is a superior resist material compared with the normally used AZ photoresists which have about 0.3-0.7 times faster etching speeds (under CF 4 plasma) than Si. [33] The etching property of NaOH was further utilized for fabricating micropatterned Si with nanoz /µm z /nm : 4 lm). b) 3D AFM image of (a) and its corresponding cross-sectional analysis.…”
Section: Resultsmentioning
confidence: 99%
“…Electron irradiation can turn surfactants into hydrogenated amorphous carbon [201, 202], which is inert for fluorinated etching process [203]. Hence, surfactants can be used as resist material for e-beam lithography in silicon based etching [202].…”
Section: Emerging Applications and Considerationsmentioning
confidence: 99%
“…Plasma etching terbagi menjadi tiga mekanisme, yaitu plasma etching secara fisis, kimia, dan RIE (Reactive Ion Etching). Beberapa penelitian sebelumnya, dilakukan plasma etching SiO2 menggunakan gas CF4 [3]. Penelitian dilakukan dengan sumber generator RF 13,56 MHz pada tekanan 5,8 mbar menghasilkan laju etching SiO2 berkisar antara 50 nm/min untuk daya 70 W. Penelitian lainnya, digunakan gas CF4/O2 dan SF6/O2 sebagai sumber dan pada frekuensi 40 kHz telah dilakukan [4].…”
Section: Pendahuluanunclassified