2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) 2014
DOI: 10.1109/pvsc.2014.6925689
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CdTe thin films doped by Cu and Ag - a comparison in substrate configuration solar cells

Abstract: One of the main problems to be solved in order to raise the efficiency of CdTe solar cells is the low acceptor concentration in polycrystalline CdTe layers which is limiting the open circuit voltage. The commonly used acceptor dopant Cu not only forms rather deep acceptor defects but is also likely to limit the net acceptor concentration due to the formation of compensating donor type defects. In this work, Ag is examined as a possible candidate for improving acceptor concentration in CdTe thin films. Hole den… Show more

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Cited by 9 publications
(7 citation statements)
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“…This is comparable to previous results, where the formation of acceptor defects (Cu’ Cd ) was assumed to be responsible for increasing carrier concentration at low Cu content, and the additional formation of compensating donors (Cu • i ) at higher Cu content reduced the net p-type conductivity [8]. The mobility has a minimum value in the range of (0.5–2)×10 15 copper atoms/cm 2 , with an increase for higher copper values.…”
Section: Resultssupporting
confidence: 91%
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“…This is comparable to previous results, where the formation of acceptor defects (Cu’ Cd ) was assumed to be responsible for increasing carrier concentration at low Cu content, and the additional formation of compensating donors (Cu • i ) at higher Cu content reduced the net p-type conductivity [8]. The mobility has a minimum value in the range of (0.5–2)×10 15 copper atoms/cm 2 , with an increase for higher copper values.…”
Section: Resultssupporting
confidence: 91%
“…First-principle calculations indicate that Cu on a Cd site (Cu’ Cd ) forms deep acceptors [6,7]. However, copper also forms compensating donors on interstitial sites (Cu • i ), and as a result the achievable hole density is limited [6,8]. At low amounts of added copper, the formation of acceptors (Cu’ Cd ) increases the p-type conductivity.…”
Section: Introductionmentioning
confidence: 99%
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“…This shows the reason for the large drop observed in J sc where the EQE was suppressed across most of the spectrum with a spike in the EQE near the band edge of CdTe >775 nm. This EQE characteristic is consistent with conversion to n‐type across some of the CdTe absorber layer thickness, creating a buried junction.…”
Section: Resultssupporting
confidence: 79%
“…A possible explanation is that compensating donors, such as copper on interstitial sites (Cu i ), are formed as well, and that the formation energy of these defects is also dependent on x. If the electronic and/or structural effects of CdTe 1−x Se x alloying facilitate the formation of compensating donors more than the formation of acceptor defects, the result is a limit to the achievable hole density [8,49,50].…”
Section: Electronic Propertiesmentioning
confidence: 99%