2010
DOI: 10.1016/j.surfcoat.2010.04.012
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Cavitation erosion behavior of nanocomposite Ti–Si–C–N and Ti/Ti–Si–C–N coatings deposited on 2Cr13 stainless steel using a Plasma Enhanced Magnetron Sputtering process

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Cited by 39 publications
(8 citation statements)
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“…X-ray diffraction (XRD) is used to investigate the crystalline phases of the Ti-Si-C-N coating. [14,[48][49][50][51][52]. These positions of the three peaks are coinciding with the values obtained in the JCPDS card [53].…”
Section: Microstructure Analysissupporting
confidence: 86%
“…X-ray diffraction (XRD) is used to investigate the crystalline phases of the Ti-Si-C-N coating. [14,[48][49][50][51][52]. These positions of the three peaks are coinciding with the values obtained in the JCPDS card [53].…”
Section: Microstructure Analysissupporting
confidence: 86%
“…Such a phenomenon has become a research hotspot in aviation, navigation, shipbuilding, and chemical engineering. Especially in the field of hydraulic machinery, valves, and ship propellers, it causes extremely severe damages for the very high repair costs, 150 billion yuan in China [8] .…”
Section: Introductionmentioning
confidence: 99%
“…Finally, at the border of the exposed area, the NP multilayer appears clearly, with holes resulting from cavitation (zone 3 in Figure c,f). This damage pattern is representative of the erosion process usually observed for bulk materials or thin coatings, which results from the multiple impacts of cavitating bubbles. ,,, …”
mentioning
confidence: 87%
“…This damage pattern is representative of the erosion process usually observed for bulk materials or thin coatings, which results from the multiple impacts of cavitating bubbles. 13,25,37,38 In the following, an experimental estimate of the relative cohesive energy density of the NP assembly is given on the basis of the surface area of multilayer removed by ultrasonic cavitation. For this, optical microscope images of the sample after each sequence of ultrasonic testing were thresholded and the surface area of the observed bare silicon substrate normalized by the area of the sonotrode tip (Figure 3b).…”
mentioning
confidence: 99%