Cause Prediction of Product Defects Using Event Causality
Hidefumi WAKAMATSU,
Itsuki HATANO,
Eiji MORINAGA
et al.
Abstract:For improving product safet y and reliability, possible defects are analyzed in advance using FMEA, FTA, and so on. However, whether such methods can predict defects depends on the knowledge and experience of engineers. In this paper, we propose a defect cause analysis method that can automatically derive possible causes without relying on the experience of engineers, and can extract causes difficult to predict. First, events and their causal relationships are modeled with Petri nets. In addition, an assembly … Show more
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