2023
DOI: 10.7791/jspmee.12.314
|View full text |Cite
|
Sign up to set email alerts
|

Cause Prediction of Product Defects Using Event Causality

Hidefumi WAKAMATSU,
Itsuki HATANO,
Eiji MORINAGA
et al.

Abstract: For improving product safet y and reliability, possible defects are analyzed in advance using FMEA, FTA, and so on. However, whether such methods can predict defects depends on the knowledge and experience of engineers. In this paper, we propose a defect cause analysis method that can automatically derive possible causes without relying on the experience of engineers, and can extract causes difficult to predict. First, events and their causal relationships are modeled with Petri nets. In addition, an assembly … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 9 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?