2022
DOI: 10.3390/ma15041332
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Cathodoluminescent Analysis of Sapphire Surface Etching Processes in a Medium-Energy Electron Beam

Abstract: Sapphire crystals are widely used in optics and optoelectronics. In this regard, it is important to study the stability of crystals under external influence and the possibility of modifying their surfaces by external influence. This work presents the results of studying the processes of the action of an electron beam with an average energy of 70 keV or less under vacuum conditions on the surfaces of sapphire substrates of various orientations. The effect of etching a sapphire surface by an electron beam in vac… Show more

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Cited by 3 publications
(1 citation statement)
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“…As candidates for low-energy lines, the typical luminescence bands associated with point defects can be considered, namely, Al vacancies [V Al ] emitting at 2.7 eV [ 65 ] and their complexes with oxygen impurities [V Al -(O N ) n ] emitting in a broad band at 3.4–3.8 eV [ 66 ], substitutional carbon on the nitrogen site and a nitrogen vacancy [C N -V N ] with a prominent 2.8 eV emission peak [ 67 ], etc. In addition, CL at 330 nm might be associated with the emission of F+ centers in the c -sapphire substrate, into which a high-energy electron beam can penetrate [ 68 ].…”
Section: Resultsmentioning
confidence: 99%
“…As candidates for low-energy lines, the typical luminescence bands associated with point defects can be considered, namely, Al vacancies [V Al ] emitting at 2.7 eV [ 65 ] and their complexes with oxygen impurities [V Al -(O N ) n ] emitting in a broad band at 3.4–3.8 eV [ 66 ], substitutional carbon on the nitrogen site and a nitrogen vacancy [C N -V N ] with a prominent 2.8 eV emission peak [ 67 ], etc. In addition, CL at 330 nm might be associated with the emission of F+ centers in the c -sapphire substrate, into which a high-energy electron beam can penetrate [ 68 ].…”
Section: Resultsmentioning
confidence: 99%