“…Cathodoluminescence (CL) detection with a scanning electron microscope (SEM) is a powerful technique for investigating the lateral distribution of defects in semi‐conductors and insulators (Yacobi & Holt, 1986; Poelman et al , 2001; Poelman et al , 2004; Hidalgo et al , 2005; Martinez et al , 2007) as well as in mineralogy (Townsend et al , 1999; Edwards et al , 2007; Pownceby et al , 2007). Depending on the energy of the primary beam (Petrov, 1992; Donolato, 1994; Gelhausen et al , 2001), the technique couples a sub‐micron spatial resolution (Gustafsson, 2006), to an excellent detection limit (Yacobi & Holt, 1986) that is orders of magnitude better than what is achievable with other techniques for micro‐analysis, like Auger electron spectroscopy (AES) and EDX.…”