2020
DOI: 10.1073/pnas.2005122117
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Cathodic electroorganic reaction on silicon oxide dielectric electrode

Abstract: The faradaic reaction at the insulator is counterintuitive. For this reason, electroorganic reactions at the dielectric layer have been scarcely investigated despite their interesting aspects and opportunities. In particular, the cathodic reaction at a silicon oxide surface under a negative potential bias remains unexplored. In this study, we utilize defective 200-nm-thick n+-Si/SiO2 as a dielectric electrode for electrolysis in an H-type divided cell to demonstrate the cathodic electroorganic reaction of anth… Show more

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Cited by 6 publications
(13 citation statements)
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“…An unusual, unique electrochemical phenomenon occurs within the silicon oxide dielectric layer in the EOS system: hydrogen atom mediated electrochemistry [13,20,21,36] . It was recognized from the asymmetric voltammetric behavior, with only the cathodic wave observed.…”
Section: Fundamental Understanding Of Electron Transfer Pathways In Silicon Oxide Dielectric Layers In Electrolyte Solutionsmentioning
confidence: 99%
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“…An unusual, unique electrochemical phenomenon occurs within the silicon oxide dielectric layer in the EOS system: hydrogen atom mediated electrochemistry [13,20,21,36] . It was recognized from the asymmetric voltammetric behavior, with only the cathodic wave observed.…”
Section: Fundamental Understanding Of Electron Transfer Pathways In Silicon Oxide Dielectric Layers In Electrolyte Solutionsmentioning
confidence: 99%
“…In particular, iridium was reduced, which is impossible via hydrogen gas reduction but is possible by hydrogen atoms under ambient conditions [13] . Moreover, electroorganic reactions of anthracene occurred when the applied voltage was lower than their reduction potentials [20] . In fact, oxidized products of anthracene and its derivatives were electrochemically generated when the silicon oxide layer was used as the cathode .…”
Section: Fundamental Understanding Of Electron Transfer Pathways In Silicon Oxide Dielectric Layers In Electrolyte Solutionsmentioning
confidence: 99%
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