2005
DOI: 10.1016/j.jelechem.2005.06.005
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Cathodic behavior of bismuth. I. Ellipsometric study of the electroreduction of thin Bi2O3 films

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Cited by 18 publications
(12 citation statements)
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“…The W-D response (Fig. 6) can be reasonably fitted employing a single-layer isotropic film model [13][14][15][16][17]. The complex refractive index (ñ f = n f À ik f ) value obtained from the fitting procedure for the tin oxide film, results ñ f = 1.45 À 0.0013i.…”
Section: Ellipsometric Characterizationmentioning
confidence: 99%
“…The W-D response (Fig. 6) can be reasonably fitted employing a single-layer isotropic film model [13][14][15][16][17]. The complex refractive index (ñ f = n f À ik f ) value obtained from the fitting procedure for the tin oxide film, results ñ f = 1.45 À 0.0013i.…”
Section: Ellipsometric Characterizationmentioning
confidence: 99%
“…In both cases, the bismuth oxidation leads to trends of the ellipsometric angles consistent with the Bi 2 O 3 film growth, i.e. decrease of D and increase of W [21]. For the sake of simplicity, only the evolution of W with time is shown in Fig.…”
Section: Stability Of Bi 2 O 3 Films Grown On Pretreated Substratesmentioning
confidence: 82%
“…The electroreduction proceeds yielding a rough/porous layer of metallic bismuth at the oxide/electrolyte interface, which grows inwards at the expense of the underneath oxide layer [21]. In addition, the roughness/porosity of the metallic layer as well as its reactivity depend on the cathodic charge passed during the electroreduction process.…”
Section: General Electrochemical Behaviormentioning
confidence: 99%
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