Conference on Lasers and Electro-Optics 2019
DOI: 10.1364/cleo_si.2019.sw3n.3
|View full text |Cite
|
Sign up to set email alerts
|

Catastrophic Degradation in High-Power Buried Heterostructure Quantum Cascade Lasers

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
5

Citation Types

0
6
0

Year Published

2022
2022
2022
2022

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(6 citation statements)
references
References 4 publications
0
6
0
Order By: Relevance
“…Facet failures in QCL appear to be directly related to thermal shear stress [9], resulting from the large temperature gradient between the core region and the heatsink, at the laser facet, when operated at high CW drive currents or when heat management is inadequate. In contrast to what is observed in strained QW lasers, where the CMDaffected area typically displays a blister on the front facet, the damaged area of QCLs is significantly extended into the InP substrate [9,67]. An SEM image after CMD is shown in Fig.…”
Section: Reliability and Failures Modesmentioning
confidence: 81%
See 4 more Smart Citations
“…Facet failures in QCL appear to be directly related to thermal shear stress [9], resulting from the large temperature gradient between the core region and the heatsink, at the laser facet, when operated at high CW drive currents or when heat management is inadequate. In contrast to what is observed in strained QW lasers, where the CMDaffected area typically displays a blister on the front facet, the damaged area of QCLs is significantly extended into the InP substrate [9,67]. An SEM image after CMD is shown in Fig.…”
Section: Reliability and Failures Modesmentioning
confidence: 81%
“…14, indicated a large void is present [67]. TEM failure analysis on devices that exhibited CMD, reveal that dislocations are not confined within the active layer, but propagate into the substrate [67]. This observation is in marked contrast to what is observed in degraded diode lasers.…”
Section: Reliability and Failures Modesmentioning
confidence: 96%
See 3 more Smart Citations