CASINO V2.42—A Fast and Easy‐to‐use Modeling Tool for Scanning Electron Microscopy and Microanalysis Users

Drouin, Dominique; Couture, Alexandre Réal; Joly, Dany; Tastet, Xavier; Aimez, Vincent; Gauvin, Raynald

doi:10.1002/sca.20000

Cited by 1,305 publications

(908 citation statements)

References 5 publications

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“…It results, in ZnO, in a generation volume of about 100 nm (with 90% power in this region, as supported by Monte Carlo simulation). 39 The CL spectra were carefully collected step by step along the radial direction across the diameter of the ZnO microwires from the inner side to the outer side by CL spectroscopy (Gatan monocle 3þ) at liquid helium temperature (8 K). The CL spectra were recorded by a CCD (charge coupled device) with a scanning range of 300 to 450 nm with a spectral resolution of about 0.5 nm.…”

Section: Methodsmentioning

confidence: 99%

Exciton Drift in Semiconductors under Uniform Strain Gradients: Application to Bent ZnO Microwires

Jacopin

Shahmohammadi

et al. 2014

ACS Nano

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Optimizing the electronic structures and carrier dynamics in semiconductors at atomic scale is an essential issue for innovative device applications. Besides the traditional chemical doping and the use of homo/heterostructures, elastic strain has been proposed as a promising possibility. Here, we report on the direct observation of the dynamics of exciton transport in a ZnO microwire under pure elastic bending deformation, by using cathodoluminescence with high temporal, spatial, and energy resolutions. We demonstrate that excitons can be effectively drifted by the strain gradient in inhomogeneous strain fields. Our observations are well reproduced by a drift-diffusion model taking into account the strain gradient and allow us to deduce an exciton mobility of 1400 ( 100 cm 2 /(eV s) in the ZnO wire. These results propose a way to tune the exciton dynamics in semiconductors and imply the possible role of strain gradient in optoelectronic and sensing nano/microdevices.

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Section: Methodsmentioning

confidence: 99%

Exciton Drift in Semiconductors under Uniform Strain Gradients: Application to Bent ZnO Microwires

Jacopin

Shahmohammadi

et al. 2014

ACS Nano

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“…Electron and helium ion trajectory plots were generated using the Monte Carlo simulation packages CASINO (Drouin et al, 2007) and SRIM (Zeigler et al, 1985;Biersack & Haggmark, 1980), respectively, to examine the different interaction volumes associated with CL and IL generation ( Figure 3). A visual comparison of the two plots in Figure 3 reveals that the interaction volume of a 20 keV electron beam in GaN is roughly 200-250 times that of the 30 keV helium ion beam.…”

Section: Direct Bad Gap Semiconductorsmentioning

confidence: 99%

Ionoluminescence in the Helium Ion Microscope

et al. 2012

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Ionoluminescence (IL) is the emission of light from a material due to excitation by an ion beam. In this work, a helium ion microscope (HIM) has been used in conjunction with a luminescence detection system to characterize IL from materials in an analogous way to how cathodoluminescence (CL) is characterized in a scanning electron microscope (SEM). A survey of the helium ion beam induced IL characteristics, including images and spectra, of a variety of materials known to exhibit CL in an SEM is presented. Direct bandgap semiconductors that luminesce strongly in the SEM, are found not do so in the HIM, possibly due to defect-related non-radiative pathways created by the ion beam. Other materials do, however, exhibit IL, including a cerium-doped garnet sample, quantum dots and rare earth doped LaPO 4 nanocrystals. These emissions are a result of transitions between f electron states or transitions across size dependent band gaps. In all these samples, IL is found to decay with exposure to the beam, fitting well to double exponential functions. In an exploration of the potential of this technique for biological tagging applications, imaging with the IL emitted by rare earth doped LaPO 4 nanocrystals, simultaneously with secondary electron imaging, is demonstrated at a range of magnifications.

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“…Because the spatial frequency spectrum of a recorded image is a function of the beam diameter, a mathematical algorithm can be used to extract the beam diameter from an SEM image of the test pattern (Babin et al, 2006). Monte Carlo simulations using the Casino 2.42 software (Hovington et al, 1997;Drouin et al, 2007) were then performed to determine the size and shape of the X-ray emission volume within the brass target. Input parameters included a target composition of 67 wt.% Cu and 33 wt.% Zn, a number of incoming primary electrons of 50,000, and the electron probe diameter measured using the Beametr v1 test sample.…”

Section: Sem Imaging Edx Analysis and Resolution Testmentioning

confidence: 99%

High-resolution 3D analyses of the shape and internal constituents of small volcanic ash particles: The contribution of SEM micro-computed tomography (SEM micro-CT)

Vonlanthen

Rausch

Ketcham

et al. 2015

Journal of Volcanology and Geothermal Research

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The morphology of small volcanic ash particles is fundamental to our understanding of magma fragmentation, and in transport modeling of volcanic plumes and clouds. Until recently, the analysis of 3D features in small objects (b250 μm) was either restricted to extrapolations from 2D approaches, partial stereo-imaging, or CT methods having limited spatial resolution and/or accessibility. In this study, an X-ray computed-tomography technique known as SEM micro-CT, also called 3D X-ray ultramicroscopy (3D XuM), was used to investigate the 3D morphology of small volcanic ash particles (125-250 μm sieve fraction), as well as their vesicle and microcrystal distribution. The samples were selected from four stratigraphically well-established tephra layers of the Meerfelder Maar (West Eifel Volcanic Field, Germany). Resolution tests performed on a Beametr v1 pattern sample along with Monte Carlo simulations of X-ray emission volumes indicated that a spatial resolution of 0.65 μm was obtained for X-ray shadow projections using a standard thermionic SEM and a bulk brass target as X-ray source. Analysis of a smaller volcanic ash particle (64-125 μm sieve fraction) showed that features with volumes N 20 μm 3 (~3.5 μm in diameter) can be successfully reconstructed and quantified. In addition, new functionalities of the Blob3D software were developed to allow the particle shape factors frequently used as input parameters in ash transport and dispersion models to be calculated. This study indicates that SEM micro-CT is very well suited to quantify the various aspects of shape in fine volcanic ash, and potentially also to investigate the 3D morphology and internal structure of any object b 0.1 mm 3 .

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CASINO V2.42—A Fast and Easy‐to‐use Modeling Tool for Scanning Electron Microscopy and Microanalysis Users

Cited by 1,305 publications

References 5 publications

Exciton Drift in Semiconductors under Uniform Strain Gradients: Application to Bent ZnO Microwires

Exciton Drift in Semiconductors under Uniform Strain Gradients: Application to Bent ZnO Microwires

Ionoluminescence in the Helium Ion Microscope

High-resolution 3D analyses of the shape and internal constituents of small volcanic ash particles: The contribution of SEM micro-computed tomography (SEM micro-CT)

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