Case Studies on Transition Fault Test Generation for At-speed Scan Testing

Zakaria, Nor Azura; Bautista, Edward V.; Jusoh, Suhaimi Bahisham; Lee, Weng Fook; Wen, Xiaoqing

doi:10.1109/dft.2010.29

2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems 2010

DOI: 10.1109/dft.2010.29

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Case Studies on Transition Fault Test Generation for At-speed Scan Testing

Nor Azura Zakaria

Edward V. Bautista

Suhaimi Bahisham Jusoh

et al.

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Case Studies on Transition Fault Test Generation for At-speed Scan Testing

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References 13 publications

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