2015
DOI: 10.1038/srep10505
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Carrier type inversion in quasi-free standing graphene: studies of local electronic and structural properties

Abstract: We investigate the local surface potential and Raman characteristics of as-grown and ex-situ hydrogen intercalated quasi-free standing graphene on 4H-SiC(0001) grown by chemical vapor deposition. Upon intercalation, transport measurements reveal a change in the carrier type from n- to p-type, accompanied by a more than three-fold increase in carrier mobility, up to μh ≈ 4540 cm2 V−1 s−1. On a local scale, Kelvin probe force microscopy provides a complete and detailed map of the surface potential distribution o… Show more

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Cited by 49 publications
(66 citation statements)
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“…Recently, KPFM measurements have been successfully employed to identify the different step configurations and number of layers in epitaxial graphene on SiC(0001) substrate . More recently, it has been demonstrated that this method can also provide direct access for the identification of graphene domains with different type of doping . In Figure a,b, and c, we show the STM, non‐contact atomic force microscopy (NC‐AFM) topography and simultaneously measured KPFM images of a surface region covered in areas of single‐layer, bilayer, and Pb‐intercalated graphene on SiC substrate, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…Recently, KPFM measurements have been successfully employed to identify the different step configurations and number of layers in epitaxial graphene on SiC(0001) substrate . More recently, it has been demonstrated that this method can also provide direct access for the identification of graphene domains with different type of doping . In Figure a,b, and c, we show the STM, non‐contact atomic force microscopy (NC‐AFM) topography and simultaneously measured KPFM images of a surface region covered in areas of single‐layer, bilayer, and Pb‐intercalated graphene on SiC substrate, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…We first employ KPFM in order to construct a layer-resolved image of the graphene structure. It has been shown, that KPFM is a powerful technique that enables mapping of the surface potential (SP) variations between different graphene layers, thus constructing a nanometer resolution map of the SP [28]. Here, FM-KPFM is used in a single pass mode, where the topography and the SP of the sample are measured simultaneously at different frequencies.…”
Section: Resultsmentioning
confidence: 99%
“…The measured surface potential difference between terrace and edges is 40 ± 10 mV for both samples. This correlation between surface potential contrast (from KPFM measurement) and number of layers (from LEEM analysis) has been ascribed to different substrate induced doping levels, as a result of the different energy dispersions of mono-and bilayer graphene [20,32,33]. Additionally, for the case of SLG a possible origin of the different doping of graphene at the steps regions could be a different interface structure between graphene and the substrate, with a local delamination of the buffer layer on the steps [34,35].…”
Section: Peem Image Ofmentioning
confidence: 95%