2018
DOI: 10.1088/1674-4926/39/6/061002
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Carrier transport mechanisms in semiconductor nanostructures and devices

Abstract: Semiconductor nanostructures have gained importance due to their potential application in future nanoelectronic devices. For such applications, it is extremely important to understand the electrical properties of semiconductor nanostructures. This review presents an overview of techniques to measure the electrical properties of individual and clusters of semiconductor nanostructures using microcopy based techniques or by fabricating metallic electrical contacts using lithography. Then it is shown that current–… Show more

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Cited by 43 publications
(13 citation statements)
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“…e value of L less than 2 ascribes that the current is attributed to the trap charge limiting current (TCLC) which is associated with the distribution of trapped charges in a junction. is behaviour is usually observed in materials with low free charge carrier concentration [22][23][24][25].…”
Section: Resultsmentioning
confidence: 97%
“…e value of L less than 2 ascribes that the current is attributed to the trap charge limiting current (TCLC) which is associated with the distribution of trapped charges in a junction. is behaviour is usually observed in materials with low free charge carrier concentration [22][23][24][25].…”
Section: Resultsmentioning
confidence: 97%
“…Based on the unique Janus TMDC materials, realizing an accurate control of their electronic and optical properties is vital to meeting the multiple needs of device design. Electric field [9,10], strain [11,12], surface decoration [13,14], and magnetic doping [15][16][17] have been proven as effective means to modulate the electronic and optical behaviors of 2D TMDCs. Among these methods, strain engineering is reversible with the controllable process, while without generating additional lattice defects and damage in the materials.…”
Section: Introductionmentioning
confidence: 99%
“…In addition, surface effects at the p–n junction, due to induced image charges that lead to a surface leakage current, can be a factor in deviating the values of ideality factors from the ideal state . To further evaluate the electrical properties of the cells, according to the SCLC behavior of solar cells in the child’s region, the values of the carrier mobility (μ) of the cells were calculated using the Mott–Gurney law (eq ) , where J is the dark current density (obtained by I /0.09), L is the separation between the electrode contacts or the thickness of the perovskite layer, ε s is the dielectric constant of perovskite (∼30), , ε 0 is the vacuum permittivity, and V is the applied voltage (0.7 V point was selected). The values obtained for the μ of cells are listed in Table .…”
Section: Resultsmentioning
confidence: 99%