2019
DOI: 10.1016/j.carbon.2019.04.115
|View full text |Cite
|
Sign up to set email alerts
|

Carbon nanotube micro-contactors on ohmic substrates for on-chip microelectromechanical probing applications at wafer level

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
15
0

Year Published

2019
2019
2022
2022

Publication Types

Select...
5

Relationship

4
1

Authors

Journals

citations
Cited by 5 publications
(15 citation statements)
references
References 70 publications
0
15
0
Order By: Relevance
“…Whilst defects may have been introduced during the bending and stretching of the CNTs, it is also possible that the top of the CNT forest may have a higher intrinsic quality than the bulk of the CNT forest due to the way the growth process is terminated. 43 It should be noted here that, when the CNTs are grown on Si wafers, the rolling method does not work due to lack of adhesion between the Si substrate and the CNT film resulting in sections of the CNT films detaching from the substrate. The Al2O3 substrate is much rougher than a standard polished Si substrate (see supplementary information Figure S3 for the substrate roughness analysis), which could have provided the better adhesion between the CNT film and the substrate.…”
Section: Resultsmentioning
confidence: 99%
See 3 more Smart Citations
“…Whilst defects may have been introduced during the bending and stretching of the CNTs, it is also possible that the top of the CNT forest may have a higher intrinsic quality than the bulk of the CNT forest due to the way the growth process is terminated. 43 It should be noted here that, when the CNTs are grown on Si wafers, the rolling method does not work due to lack of adhesion between the Si substrate and the CNT film resulting in sections of the CNT films detaching from the substrate. The Al2O3 substrate is much rougher than a standard polished Si substrate (see supplementary information Figure S3 for the substrate roughness analysis), which could have provided the better adhesion between the CNT film and the substrate.…”
Section: Resultsmentioning
confidence: 99%
“…Electromechanical characterization of the composite films is carried out using a reconfigured setup described here, consisting of a high-precision, ultralow load, single-point load cell (Tedea-Huntleigh 0.3 kg with a load cell amplifier) attached to a motorized z-stage (Thorlabs 300 mm DC Servo Stage with TDC 001 controller, controlled via Kinesis software), a displacement laser (Keyence LK-G), and a source/measure unit (see Figure S2 for the experimental setup visualization). For tensile stress–strain tests, CNT-PDMS films are affixed between a base stage and a motorized stage via Cu clamps.…”
Section: Methodsmentioning
confidence: 99%
See 2 more Smart Citations
“…The PTCVD system was operated at around 400–420 °C substrate temperature, measured using a bulk pyrometer. 67 The Fe 0 catalyst was activated for 5 min under 100 sccm H 2 , immediately followed by 5 min growth under 100 sccm H 2 and 25 sccm (acetylene) C 2 H 2 at 5 torr chamber pressure. After 5 min, C 2 H 2 supply was cut-off, hydrogen (H 2 ) was allowed to flowing into the chamber with the optical light on for an extra minute to avoid amorphous carbon built-up on the tip of the CNTs.…”
Section: Methodsmentioning
confidence: 99%