Our system is currently under heavy load due to increased usage. We're actively working on upgrades to improve performance. Thank you for your patience.
2016
DOI: 10.2174/1573413712666151216221629
|View full text |Cite
|
Sign up to set email alerts
|

Carbon Nano Tube Field Effect Transistors Based Ternary Ex-OR and Ex-NOR Gates

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
6
0

Year Published

2018
2018
2024
2024

Publication Types

Select...
6
2
1

Relationship

2
7

Authors

Journals

citations
Cited by 22 publications
(6 citation statements)
references
References 0 publications
0
6
0
Order By: Relevance
“…In Real-Time Fault-Tolerant Full Adder design approach the number of hardware components is high due to redundancy in design and thus are more costly [32]- [33]. Due to the redundant circuit design, critical path delay is increased and thereby increases the overall circuit delay [34]- [38].…”
Section: Existing Fault-tolerant Circuit Designs Approachmentioning
confidence: 99%
“…In Real-Time Fault-Tolerant Full Adder design approach the number of hardware components is high due to redundancy in design and thus are more costly [32]- [33]. Due to the redundant circuit design, critical path delay is increased and thereby increases the overall circuit delay [34]- [38].…”
Section: Existing Fault-tolerant Circuit Designs Approachmentioning
confidence: 99%
“…The CNTFET's mathematical relation for threshold voltage is determined by (1) Vth≃Ebg/2e ≃ 0.436/Dcnt (nm) (1) where Ebg is the energy band gap of carbon nano-tube, e is the charge of electron and Dcnt is the diameter of the carbon nano-tube. It can be seen from (1) that the threshold voltage of a CNTFET is inversely related to the diameter of its nano-tubes, which is computed by (2) 0.0783…”
Section: Heavily Doped Cnt Segments For Source/drainmentioning
confidence: 99%
“…This research was performed in the Microelectronics Laboratory of BITS Pilani, K. K. Birla Goa Campus, India. performance elevated compact circuits [1][2][3]. These challenges could be overcome by introducing the recently developed CMOS nano-devices viz CNTFET, Quantum Dot Cellular Automation (QCA) and also Single Electron Technology (SET), which are believed to be able to replace conventional CMOS technology [4] in the near future.…”
Section: Introductionmentioning
confidence: 99%
“…Currently, CNTFETs and GNRFETs are drawing wide attention of researchers due to their extensive electrical mechanical properties. CNTFET and GNRFET based ternary logic systems have been reported in literature, [9][10][11][12][13] where implemented different logic levels have been realized using tuning the threshold voltages. However, one of the major challenge is in fabrication where it becomes very difficult to design different CNTFET based logic gates.…”
mentioning
confidence: 99%