Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometry

Harton, Shane E.; Stevie, F. A.; Ade, Harald

doi:10.1016/j.jasms.2006.03.018

Cited by 11 publications

(24 citation statements)

References 21 publications

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“…Static SIMS uses low intensity projectile primary beams (\10 13 ions/cm 2 ), which minimizes sample damage and makes the method mostly non-destructive. Dynamic SIMS on the other hand employs intense primary beams ([10 13 ions/cm 2 ), which results to surface sputtering, damages the sample but also allows depth profiling from few nanometers to several hundreds of micrometers (Harton et al 2006). Both, static and dynamic SIMS can be used for imaging but static configuration provides better spatial resolution (Hoshi and Kudo 2003).…”

Section: Simsmentioning

confidence: 99%

Molecular mass spectrometry imaging in biomedical and life science research

Pól

Strohalm

Havlı́ček

et al. 2010

Histochem Cell Biol

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This review describes the current state of mass spectrometry imaging (MSI) in life sciences. A brief overview of mass spectrometry principles is presented followed by a thorough introduction to the MSI workflows, principles and areas of application. Three major desorption-ionization techniques used in MSI, namely, secondary ion mass spectrometry (SIMS), matrix-assisted laser desorption ionization (MALDI), and desorption electrospray ionization (DESI) are described, and biomedical and life science imaging applications of each ionization technique are reviewed. A separate section is devoted to data handling and current challenges and future perspectives are briefly discussed at the end.

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Section: Simsmentioning

confidence: 99%

Molecular mass spectrometry imaging in biomedical and life science research

Pól

Strohalm

Havlı́ček

et al. 2010

Histochem Cell Biol

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“…10,11 Polystyrene is also highly hydrophobic, thereby minimizing background 1 H during SIMS analysis. 24 Analysis of deuterium-labeled PS is necessary for the investigation of hydrogen mass fractionation because the natural abundance of deuterium ͑ 2 H͒ is only 0.015%, 25 making accurate depth profiling of naturally occurring 2 H very difficult.…”

Section: A Materials and Sample Preparationmentioning

confidence: 99%

“…22 In contrast, 13 C is a relatively abundant minor isotope ͑1.1%͒. 10,11,25 Time-of-flight ͑ToF͒ SIMS was used to characterize the degree of deuterium substitution in the dPS ͑ d ͒. 11,26 For this, Si ͑100͒wafers were cut into 1 ϫ 1 cm 2 squares, soaked in BakerClean JTB-111 ͑J.…”

Section: A Materials and Sample Preparationmentioning

confidence: 99%

“…31 For Cs + primary ion bombardment, typical analysis conditions included a 4 nA primary current rastered over a 120ϫ 120 m 2 area, with 6.0 keV impact energy ͑5 kV primary with −1 kV sample bias͒ and m / ⌬m = 3100 for both carbon and hydrogen fractionation measurements. 10,11 The angle of incidence for the primary ions was 27°. Negative secondary ions were detected from a 30 m diameter optically gated area positioned in the center of the raster.…”

Section: Dynamic Sims Analysismentioning

confidence: 99%

“…8,9 Therefore, isotopic labeling is often employed to more accurately characterize organic materials. 10,11 Isotopic labeling has also been shown to greatly minimize matrix effects 12,13 that occur through heterogeneous interfaces, 10,11 but a phenomenon known as mass fractionation is especially prevalent in low mass secondary ions such as carbon and hydrogen. [14][15][16][17][18] Mass fractionation occurs because two isotopes of a particular species ͑i.e., identical number of protons, but different number of neutrons͒ do not have identical secondary ion yields in a constant chemical environment.…”

Section: Introductionmentioning

confidence: 99%

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Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O2+ bombardment of organic materials

Harton

Zhu

Stevie

et al. 2007

Journal of Vacuum Science &Amp; Technology A: Vacuum, Surfaces, and Films

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A phenomenon known as mass fractionation has been probed in organic materials using secondary ion mass spectrometry (SIMS). Mass fractionation occurs because two isotopes of a particular species (i.e., identical number of protons, but different number of neutrons) do not have identical secondary ion yields in a constant chemical environment. Two primary ion probes, Cs+ and O2+, have been utilized with detection of negative and positive secondary ions, respectively, using a magnetic sector mass spectrometer. These two analysis conditions have been found to yield considerably different mass fractionation effects as a result of different sputtering and ionization mechanisms. Also, as determined previously with SIMS analysis of inorganic materials, the lower molecular weight species carbon and hydrogen are particularly susceptible to mass fractionation effects. Because organic materials are primarily composed of carbon and hydrogen, and because isotopic labeling is often utilized to accurately analyze such materials, knowledge of these effects in organic materials is essential for quantitative SIMS analysis.

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Current literature in mass spectrometry

2007

J. Mass Spectrom.

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show abstract

Carbon-13 labeling for improved tracer depth profiling of organic materials using secondary ion mass spectrometry

Cited by 11 publications

References 21 publications

Molecular mass spectrometry imaging in biomedical and life science research

Molecular mass spectrometry imaging in biomedical and life science research

Mass fractionation of carbon and hydrogen secondary ions upon Cs+ and O2+ bombardment of organic materials

Current literature in mass spectrometry

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