“…A first study has been made to compare the textures measured by X-ray diffraction and by electron 0021-8898/93/020207-07506.00 backscattering diffraction (Dingley, 1988) on three Fe-3%Si samples at the surface, at one fifth of the thickness from the surface and at the centre of a primary recrystallized sheet (Rouag, 1988;Penelle, Baudin, Paillard & Mora, 1991;Baudin, Paillard & Penelle, 1992). One fifth of the thickness was chosen because it has been shown that, during the final annealing of secondary recrystallization, which is performed in a hydrogen atmosphere, Goss grains expand in the subsurface between one fourth and one fifth of the sheet thickness from the surface.…”