Capillary μFocus X-ray lenses with parabolic and elliptic profile

Bjeoumikhov, A.; Erko, M.; Bjeoumikhova, S.; Erko, Alexei; Snigirev, A.; Wolff, Timo de; Mantouvalou, Ioanna; Malzer, Wolfgang; Kanngießer, Birgit

doi:10.1016/j.nima.2008.01.087

Cited by 21 publications

(14 citation statements)

References 12 publications

(11 reference statements)

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“…They may be classified into three different categories: polycapillaries (Kumakhov, 2000;Bjeoumikhov et al, 2008), multi-bounce capillaries (Engströ m & Riekel, 1996) and single-bounce capillaries (Huang & Bilderback, 2006). These are achromatic devices, making them suitable for spectroscopy experiments.…”

Section: Introductionmentioning

confidence: 99%

High-flux hard X-ray microbeam using a single-bounce capillary with doubly focused undulator beam

Barrea

Huang

Cornaby

et al. 2008

J Synchrotron Radiat

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A pre-focused X-ray beam at 12 keV and 9 keV has been used to illuminate a single-bounce capillary in order to generate a high-flux X-ray microbeam. The BioCAT undulator X-ray beamline 18ID at the Advanced Photon Source was used to generate the pre-focused beam containing 1.2 Â 10 13 photons s À1 using a sagittal-focusing double-crystal monochromator and a bimorph mirror. The capillary entrance was aligned with the focal point of the pre-focused beam in order to accept the full flux of the undulator beam. Two alignment configurations were tested: (i) where the center of the capillary was aligned with the pre-focused beam ('in-line') and (ii) where one side of the capillary was aligned with the beam ('off-line'). The latter arrangement delivered more flux (3.3 Â 10 12 photons s À1) and smaller spot sizes ( 10 mm FWHM in both directions) for a photon flux density of 4.2 Â 10 10 photons s À1 mm À2 . The combination of the beamline main optics with a large-working-distance (approximately 24 mm) capillary used in this experiment makes it suitable for many microprobe fluorescence applications that require a micrometer-size X-ray beam and high flux density. These features are advantageous for biological samples, where typical metal concentrations are in the range of a few ng cm À2. Micro-XANES experiments are also feasible using this combined optical arrangement.

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Section: Introductionmentioning

confidence: 99%

High-flux hard X-ray microbeam using a single-bounce capillary with doubly focused undulator beam

Barrea

Huang

Cornaby

et al. 2008

J Synchrotron Radiat

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“…Therefore, a full poly-capillary lens has two parabolic parts. The X-rays from point source become parallel beam by the front part, and then they are focused on a small point by the rear part [18]. In this work, parallel X-ray beam from synchrotron light source is used.…”

Section: Methodsmentioning

confidence: 99%

Quick Observation of Photoelectron Emission Microscopy with Focused Soft X-rays using Poly-capillary Lens

Hirao

Baba

Sekiguchi

et al. 2011

JSA

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In order to study dynamic phenomena in a microscopic region of solid surfaces, it is important to observe element, chemical-state, and molecular-orientation mappings at nanometer scale in a short time. In the previous study, we have developed a photoelectron emission microscopy (PEEM) system combined with soft X-rays from synchrotron light source, and demonstrated that the method can be applied to the observation on chemical-state mapping of silicon compounds at nanometer scale [1]. In the present work, in order to apply this method to the observation of fast phenomena, we explored the focusing of soft X-ray (1.8-4 keV) using a poly-capillary lens, and examined the minimum measuring time by PEEM. By adjusting the poly-capillary lens, the brightness of the measuring spot by PEEM became about 55 times higher than that without the lens. Consequently, we can take a PEEM image of a bulk sample in 10 msec. The measuring times for elemental mapping and chemical-state mapping were also examined by scanning the energy of X-ray. As a result, the typical minimum measuring times were in the order of 10 sec for elemental mapping and one minute for chemical-state mapping. It is demonstrated that the method will be applicable to the real-time observation of time-dependent phenomena in the order from msec to sec at nanometer scale.

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“…These optical elements are presently the best high-resolution optical elements used in x-ray microscopy and microprobes. Good results were also obtained using capillaries [4] and refractive focusing optical elements [5]. Studies leading to the improvement of these elements are continuing.…”

Section: Introductionmentioning

confidence: 94%

Germanium-Based Circular Zone Plates for Soft and Hard X-Rays

Firsov¹,

Belkhou²,

Idir³

et al. 2011

AIP Conference Proceedings

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Abstract. Development of a technological basis for the fabrication of diffraction optical elements has been underway at Synchrotron SOLEIL since April 2009. These diffraction focusing elements are: zone plates and condenser lenses for soft x-rays (80-2500 eV), focusing zone plates for hard x-rays (4-24 keV), and diffraction elements working under complete external reflection conditions with elliptical diffraction zones and a topology appropriate to operate at a glancing incidence to fulfill the conditions of total external reflection (energy range 100-1500 eV). This work discusses fabrication of circular germanium-based zone plates and results of numerical calculations of the behavior of zone plates with real topologies under real experimental conditions. The software used for these calculations allows us to take into account the undercut of zones that occurs after plasmachemical etching as well as variations in the zone heights. Such variations could be used to correct or improve zone plate efficiency after electroplating or plasmachemical etching and can be performed by a focused ion beam etching [1] (direct or with active gas assistance). Data preparation and ion beam control for these corrections can be carried out by Nanomaker software (Interface Ltd).

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Capillary μFocus X-ray lenses with parabolic and elliptic profile

Cited by 21 publications

References 12 publications

High-flux hard X-ray microbeam using a single-bounce capillary with doubly focused undulator beam

High-flux hard X-ray microbeam using a single-bounce capillary with doubly focused undulator beam

Quick Observation of Photoelectron Emission Microscopy with Focused Soft X-rays using Poly-capillary Lens

Germanium-Based Circular Zone Plates for Soft and Hard X-Rays

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