2020 IEEE 33rd International Conference on Micro Electro Mechanical Systems (MEMS) 2020
DOI: 10.1109/mems46641.2020.9056301
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Capacitive Lamé Mode Resonators in $65\ \mu \mathrm{m}$-Thick Monocrystalline Silicon Carbide with Q-Factors Exceeding 20 Million

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Cited by 13 publications
(11 citation statements)
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“…In this work, the side-supported Lamé resonator requires only in-plane decoupling; the tethers are augmented with square-shaped unit cells of critical dimension on the order of the quarter wavelength (λ/4) of the shear Lamé wave [10]. A similar phononic crystal has been implemented in nearly Akhiezer-limited silicon resonators making this design an excellent candidate for this work [38].…”
Section: B Pnc: Anchor Loss Mitigation Spurious Mode Suppressionmentioning
confidence: 99%
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“…In this work, the side-supported Lamé resonator requires only in-plane decoupling; the tethers are augmented with square-shaped unit cells of critical dimension on the order of the quarter wavelength (λ/4) of the shear Lamé wave [10]. A similar phononic crystal has been implemented in nearly Akhiezer-limited silicon resonators making this design an excellent candidate for this work [38].…”
Section: B Pnc: Anchor Loss Mitigation Spurious Mode Suppressionmentioning
confidence: 99%
“…Fabrication of devices follows the process as detailed in [10]. SiCOI substrates with 65 μm n-type 4H-SiC device layer on a 380 μm Si handle layer separated by a thermally-grown silicon dioxide interlayer were custom-made in a process slightly modified from [17].…”
Section: Fabricationmentioning
confidence: 99%
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“…However, the limited deployment base of high-density dry etchers dedicated to SiC wafer-level processing severely obstructs basic research. To wit, there are few papers focused on deep reactive ion etching (DRIE) of SiC (4) and even fewer on DRIE of SiCOI substrates (5) for ultra-high Q MEMS applications (6). This paper focuses on the challenges in developing a SiC MEMS technology platform for applications requiring ultra-low dissipation.…”
Section: Introductionmentioning
confidence: 99%
“…Enormous efforts have been made in recent years to demonstrate the high-quality factors (Q) of the bulk acoustic wave (BAW) mode resonator in comparison to flexural beam resonators [9]. However, the electrostatic actuation/detection of such stiff mechanical modes requires considerably high bias voltages [10][11][12][13][14][15][16][17]. The high voltage limits the practical applications of BAW resonators [18].…”
Section: Introductionmentioning
confidence: 99%