1979
DOI: 10.1063/1.326411
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Capacitance-vs-voltage characteristics of ZnO varistors

Abstract: Studies were made on the capacitance-vs-voltage characteristics of ZnO varistors which contain rare-earth metal oxides and cobalt oxide. On the basis of the symmetrical

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Cited by 422 publications
(166 citation statements)
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“…Such long-term aging simulation aims at portraying the migration process of mobile donor ions and their neutralization with interfacial acceptor states. Various kinds of defect ions are considered, and simulated aging characteristics are compared with experimental aging data of quasi-bicrystal 77,78 to identify the dominant mobile species.…”
Section: Identification Of Dominant Mobile Ionmentioning
confidence: 99%
“…Such long-term aging simulation aims at portraying the migration process of mobile donor ions and their neutralization with interfacial acceptor states. Various kinds of defect ions are considered, and simulated aging characteristics are compared with experimental aging data of quasi-bicrystal 77,78 to identify the dominant mobile species.…”
Section: Identification Of Dominant Mobile Ionmentioning
confidence: 99%
“…The results of VI curve measured by TLP are presented in Journal of the Ceramic Society of Japan 124 [6] 684-688 2016 JCS-Japan formed at grain boundaries, and linearity in high current responsible for ohmic resistance of ZnO grains. 1), 8) In the case of SrCoO 3 doped-ZnO, as stated in our previous paper, non-linearity arises from hetero-junctions comprising n-p (ZnO/SrCoO 3 ) and p-n (SrCoO 3 /ZnO) between ZnO grains. 5) The results over a wide range of currentvoltage using TLP suggest that the dominant path of current flow above 1 A is through ohmic ZnO grains without potential barriers, because of linear VI behavior depending on applied voltage.…”
Section: Tlp Analysis Of Effect Of Zno Grain Resistivity On Esd Stabimentioning
confidence: 70%
“…The CV measurement method is effective in yielding the values of ¤ and N D ; 12) however, it becomes ineffective when the emission and/or capture of carriers by the trap levels at the grain boundaries and in ZnO grains do/does not occur. Thus, trap levels were analyzed by using ICTS.…”
Section: Resultsmentioning
confidence: 99%